Apparatus for Properties Measurement of Semiconductor Laser

This semiconductor laser characteristics experiment system is designed to study the optical and electrical properties of semiconductor lasers. It enables students to measure beam divergence, voltage-current characteristics, optical power output, threshold current, temperature dependence, and polarization characteristics. The system also supports verification of Malus’s Law as an optional experiment. Manufactured by Atico Export India.

Semiconductor Laser :

• Output Power: <2 mW
• Center Wavelength: 650 nm

Semiconductor Laser Power Supply :

• 0–4 V DC
• Continuously adjustable
• Resolution: 0.01 V

Photo Detector :

• Silicon detector with 2 mm aperture

Angle Sensor :

• Measurement Range: 0–180°
• Resolution: 0.1°

Polarizer :

• Aperture: 20 mm
• Rotation Range: 0–360°
• Resolution: 1°

Light Screen :

• 150 × 100 mm

Voltmeter :

• Measurement Range: 0–20.00 V
• Resolution: 0.01 V

Laser Power Meter :

• Measurement Range: 2 μW–2 mW
• 4 measurement ranges

Temperature Controller :

• Control Range: Room temperature to 80 °C
• Resolution: 0.1 °C

Standard Accessories :

• Main Carrying Case – 1
• Laser Support and Angle Sensing Device – 1 Set
• Semiconductor Laser – 1
• Slide Rail – 1
• Slides – 3
• Polarizers – 2
• White Screen – 1
• White Screen Support – 1
• Photo Detector – 1
• 3-Core Cable – 3
• 5-Core Cable – 1
• Red Connection Wires (2 Short, 1 Long) – 3
• Black Connection Wire (Medium) – 1
• Black Connection Wires (Large, 1 Short & 1 Long) – 2
• Power Cord – 1
• Instruction Manual – 1