Apparatus for Properties Measurement of Semiconductor Laser Apparatus

The Apparatus for Properties Measurement of Semiconductor Laser Apparatus is designed for the study of the electrical and optical characteristics of low-power semiconductor lasers. The system provides a comprehensive platform for investigating laser performance, operating principles, and important laser parameters through practical experimentation. The apparatus integrates a semiconductor laser module with temperature control, optical power measurement, angle sensing, polarization analysis, and electrical characterization functions. Students can study laser behavior under different operating conditions and gain hands-on experience with laser measurement techniques commonly used in photonics and optoelectronics. The system enables detailed investigation of laser output characteristics, threshold current, beam divergence, polarization properties, and temperature effects on laser performance. Its integrated design ensures accurate measurements, ease of operation, and reliable experimental results, making it ideal for physics, optics, photonics, and engineering laboratories. Manufactured by Atico Export India.

Experiments :

Far-Field Distribution Measurement :

• Measure the far-field intensity distribution of the laser beam.
• Determine horizontal and vertical beam divergence angles.

Voltage-Current Characteristics :

• Measure the voltage-current (V-I) characteristics of the semiconductor laser.

Optical Power versus Driving Current :

• Measure the relationship between optical output power and injection current.
• Determine the threshold current of the laser.

Temperature Characteristics :

• Measure optical power versus current at different temperatures.
• Analyze the influence of temperature on laser performance.

Polarization Characteristics :

• Investigate the polarization properties of the laser beam.
• Calculate the polarization ratio.

• Semiconductor Laser Characterization
• Laser Physics Education
• Optoelectronics Training
• Beam Divergence Measurements
• Polarization Studies
• Photonics Laboratory Experiments
• Engineering and Physics Education

Optional Experiment :

• Verification of Malus's Law.

Semiconductor Laser :

Output Power :

• Less than 2 mW

Center Wavelength :

• 650 nm

Laser Power Supply :

Output Voltage :

• 0 – 4 V DC, Continuously Adjustable

Resolution :

• 0.01 V

Photo Detector :

Detector Type :

• Silicon Detector

Aperture Diameter :

• 2 mm

Angle Sensor :

Measurement Range :

• 0° – 180°

Resolution :

• 0.1°

Polarizer :

Aperture :

• 20 mm

Rotation Range :

• 0° – 360°

Resolution :

• 1°

Light Screen :

Size :

• 150 mm × 100 mm

Voltmeter :

Measurement Range :

• 0 – 20.00 V

Resolution :

• 0.01 V

Laser Power Meter :

Measurement Range :

• 2 µW – 2 mW

Number of Scales :

• 4

Temperature Controller :

Control Range :

• Ambient Temperature to 80°C

Resolution :

• 0.1°C

Main Control Unit :

• Quantity: 1

Laser Support and Angle Sensing Device :

• Quantity: 1 Set

Semiconductor Laser :

• Quantity: 1

Slide Rail :

• Quantity: 1

Slides :

• Quantity: 3

Polarizers :

• Quantity: 2

White Screen :

• Quantity: 1

White Screen Support :

• Quantity: 1

Photo Detector :

• Quantity: 1

3-Core Cables :

• Quantity: 3

5-Core Cable :

• Quantity: 1

Red Connection Wires :

• Quantity: 3

Black Connection Wires :

• Quantity: 3

Power Cord :

• Quantity: 1

Instruction Manual :

• Quantity: 1

• Rich Experimental Content
• Convenient Operation
• Stable and Reliable Performance
• Complete Experimental System
• Comprehensive Optical and Electrical Measurements
• Detailed Instruction Manual