Experimental Ellipsometer Optics Educational Kits

The Experimental Ellipsometer Optics Educational Kits is a teaching and demonstration instrument designed to introduce students to the principles and applications of ellipsometry. The system enables the study of polarization changes that occur when light is reflected from thin-film surfaces, providing practical insight into one of the most important optical characterization techniques used in material science. In operation, an initially unpolarized light beam is converted into linearly polarized light and then transformed into elliptically polarized light using optical polarization elements. When the beam reflects from a thin-film sample, its polarization state changes according to the optical properties of the material. By analyzing these changes, important parameters such as film thickness and refractive index can be determined. The apparatus provides hands-on experience with polarization optics, reflection phenomena, and thin-film characterization, making it an ideal educational tool for physics, optics, photonics, and material science laboratories. Manufactured by Atico Export India.

Experiments :

Polarization by Reflection :

• Study how the polarization state of light changes upon reflection from material surfaces.

Thin Film Thickness Measurement :

• Determine the thickness of thin films through polarization analysis.

Refractive Index Measurement :

• Measure the refractive index of thin-film materials using ellipsometric techniques.

Ellipsometry Principles and Operation :

• Understand the working principles of ellipsometry and its applications in material characterization.

• Ideal for Demonstration and Educational Use
• Study of Polarization by Reflection
• Thin Film Refractive Index Measurement
• Thin Film Thickness Measurement
• Manual Operation for Hands-On Learning
• Detailed Instruction Manual

Thickness Measurement Range :

• 1 nm – 300 nm

Incident Angle Range :

• 30° – 90°

Incident Angle Error :

• ≤ 0.1°

Polarizer & Analyzer Intersection Angle :

• 0° – 180°

Angular Scale Division :

• 2° per Division

Vernier Minimum Reading :

• 0.05°

Optical Center Height :

• 152 mm

Work Stage Diameter :

• Ø 50 mm

Overall Dimensions :

• 730 × 230 × 290 mm

Weight :

• Approx. 20 kg

Ellipsometer Unit :

• Quantity: 1

He-Ne Laser :

• Quantity: 1

Photoelectric Amplifier :

• Quantity: 1

Photocell Detector :

• Quantity: 1

Thin Film Sample on Silicon Substrate :

• Quantity: 1

Analysis Software :

• Quantity: 1

Instruction Manual :

• Quantity: 1

• Thin Film Characterization
• Refractive Index Measurement
• Thickness Measurement of Coatings
• Polarization Studies
• Optics and Photonics Education
• Material Science Laboratory Training