Surface Magneto Optical Kerr Effect Comprehensive Physics Lab Experimental Instrument

This experimental system is designed for the study of the surface magneto-optical Kerr effect (MOKE), enabling investigation of the interaction between polarized light and magnetic materials. The system allows users to analyze changes in the polarization state of reflected light under the influence of an external magnetic field and explore magneto-optical properties of material surfaces.

The modular platform integrates an electromagnet assembly, optical path system, control electronics, and data acquisition components, providing a comprehensive environment for magneto-optical measurements. The system supports both polar and longitudinal Kerr effect studies and offers practical experience in optical alignment, magnetic field control, and signal analysis.

• Magneto-optical material research
• Magnetic thin-film characterization
• Optical polarization studies
• Magnetic property analysis
• Materials science education
• Advanced optics and photonics laboratories
• Surface magneto-optical Kerr effect studies
• Polar Kerr effect measurements
• Longitudinal Kerr effect measurements
• Magneto-optical material characterization
• Polarization analysis
• Magnetic hysteresis investigation
• Optical signal detection and processing
• Experimental studies in optics and magnetism

• Electromagnet System
• Optical Path Assembly
• Main Control Unit
• Optical Experimental Platform
• Data Acquisition and Analysis System

Main Configuration & Specifications

Optical Experimental Platform :

Platform Material :

• Oxidized aluminum alloy

Platform Size :

• 38 cm × 21.5 cm

Platform Thickness :

• 16 mm

Maximum Rotating Arm Span :

• Approximately 117 cm

Rotating Arm Design :

• Freely adjustable around the platform center

Laser Source :

Type :

• Semiconductor Laser

Output Power :

• ≥ 20 mW

Wavelength :

• 650 nm

Minimum Spot Diameter :

• Approximately 1 mm

Polarization Optics :

Polarizing Components :

• Precision polarizing prisms

Aperture Diameter :

• 8 mm

Rotation Resolution :

• 1°

Rotation Range :

• 0–360°

Micrometer Travel :

• 10 mm

Micrometer Resolution :

• 0.01 mm

Angular Measurement Resolution :

• Approximately 1.9 arc minutes

Detection & Acquisition System :

Detector :

• Silicon photodiode

Data Acquisition :

• 12-bit AD/DA interface

Optical Signal Measurement and Processing Module :

• Included

Electromagnet System :

Maximum Magnetic Field Strength :

• < 5000 Gauss

Magnetic Gap Width :

• Adjustable from 0–30 mm

Constant Current Power Supply :

Output Range 1 :

• 0–20 V, 0–4 A continuously adjustable

Output Range 2 :

• 0–40 V, 0–10 A continuously adjustable

Control & Display :

Kerr Signal Display :

• 3½-digit digital display
• Measurement range: 0–2 V
• Resolution: 0.01 V

Scanning Power Supply Display :

• 3½-digit digital display
• Measurement range: 0–20 A
• Resolution: 0.01 A

Measurement Performance :

Kerr Signal Resolution :

• Up to 0.04% signal variation

Detection Sensitivity :

• Sub-millidegree level